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Compute DPU, DPO, DPMO, process yield, and Six Sigma level from units inspected, opportunities per unit, and defects found — with the standard 1.5σ long-term shift applied. All in your browser, no account required.
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DPMO (Defects Per Million Opportunities) measures defect rate normalized to one million chances for a defect. DPMO = (Defects ÷ (Units × Opportunities per Unit)) × 1,000,000. It lets you compare defect rates fairly across processes with different numbers of defect opportunities per unit.
DPU (Defects Per Unit) is defects divided by units inspected — it ignores how many ways each unit could fail. DPO (Defects Per Opportunity) divides defects by the total number of defect opportunities (units × opportunities per unit), normalizing for complexity. DPMO simply scales DPO by one million so the numbers are easier to compare and read.
The 1.5-sigma shift accounts for long-term process drift that isn't visible in short-term data — a process centered today typically drifts up to about 1.5 standard deviations over time. Motorola introduced this convention with Six Sigma, so a process quoted as '6 sigma' (3.4 DPMO) already has the shift built in, rather than representing a purely short-term, perfectly centered distribution.
Count every independent characteristic or step that could reasonably produce a defect — for example, a PCB assembly might have one opportunity per solder joint, or a machined part might have one per critical dimension. Be consistent between measurement periods, since changing the opportunity count changes DPMO even if the true defect rate hasn't changed.
3-sigma (about 66,800 DPMO) is roughly the historical industry average for many processes. 4-sigma (about 6,210 DPMO) is a common improvement target. 6-sigma (3.4 DPMO) is the benchmark for world-class quality, popularized by Motorola and GE's Six Sigma programs.
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